Métodos microscópicos de superfície são importantes para caracterizar uma estrutura de novos materiais
For decades, scanning microscopy (SPM), low-energy electron microscopy (LEEM) and photoelectron emission microscopy (PEEM) have been proven techniques to study at both micro and nano scales. The characterization of new materials, nanomaterials and nanostructures different types of information to determine their properties, and the information is very important to understand growth, electronic structure or reactivity. This information can be obtained by microscopic methods. In addition, these techniques provide spectroscopic information and, when combined, spectroscopic data provide an integrated and related view of material properties.
The SPM system in Ultra High Vacuum is the most reliable tool to study the structure of conductive and insulating surfaces in real space with lateral resolution, which allows to build images of structures the size of individual atoms. Highly stable SPM systems like the Aarhus SPM 150 have made it possible to atomically resolve STM and AFM images at varying temperatures and even varying pressures, in everyday use. SPM systems can be used in isolation, but also as a module (due to their stability) connected to a multi-method system. When using a Nanonis Mimea Control system, the SPM’s performance will be unmatched.
The FE-LEEM P90 SPECS LEEM instrument is a next generation low energy electron microscope with 5 nm resolution, unsurpassed for dynamic LEEM microscopy experiments. With this instrument, based on Dr. Rudolf Tromp’s project, surface processes on a nanoscale can be observed in real time. The instrument is always equipped with an energy filter for spectromicroscopy and is available in standard version, version with aberration correction for lateral LEEM resolution below 2 nm and Near Ambient Pressure version for studies in pressures up to 1 mbar.
Examples of application
- Material characterization
- Materials Engineering
- 2D materials